In today's electronics business, managing an ESD progranris an integral part of a complete quality program. In fact, any electronics firm without an active ESD program puts itself and its customers at risk. This book illustrates one good example of the detail and dedication to quality that AT&T expects within its own operations and from its suppliers. Writing of the book began at a time when Ted Dangelmayer was burdened with many demands. These demands were from AT&T's own operations, internal suppliers, external suppliers, customers and others looking for a better understanding of the phenomenon of ESD, its impact and, most of all, ways to control and manage it. In a way, this book is a response to these demands by making available a reader friendly document that distills the hard-won experiences of Ted and AT&T. The information and methods in this book have been gained at no small cost and produce results that far exceed eXRenses. There is, however, a caveat: Success will not be obtained unless there is real management commitment. This means management must allocate the necessary resources and provide active support to ensure that training, auditing, reporting, tracking and an aggressive corrective action program all take place successfully. Ted is an internationally recognized authority, and you will benefit greatly by listening to his advice and following his recommendations.

This is a revision of the highly successful electronic manufacturing guide, ESD Program Management: A Realistic Approach to Continuous Measurable Improvement in Static Control. This revision is comprehensive and explains how to develop, implement and manage an ESD control program, and includes up-to-date data, many new chapters, new case studies, and much more. New to this edition: Extensive changes and additions to auditing techniques, cost benefits data, and materials evaluation. Six new chapters on common myths, issues related to smaller companies, process controls, ISO 9000, material characterization, and training. New case studies on field-induced failures in the factory, long-distance central office system upsets, and automation-caused failures. Expanded coverage of the needs of smaller companies including discussion of common problems and cost-effective solutions. A training breakthrough is presented. Previously invisible ESD events can now be easily displayed for students at all levels - `Seeing is believing!' Inclusion of new testing instruments such as the event detector and resistance probe. The 12 critical factors in an ESD program have been updated to reflect changes and refinements in program management. The author has also included the latest information on handling procedures and requirements from the Lucent ESD Control Handbook. ESD Program Management: A Realistic Approach to Continuous Measurable Improvement in Static Control, Second Edition, is a refreshingly unbiased guide for electronic manufacturing and quality control professionals.

In today's electronics business, managing an ESO program is an integral part of a complete quality program. In fact, any electronics firm without an active ESO program puts itself and its customers at risk. This book illustrates one good example of the detail and dedication to quality that AT&T expects within its own operations and from its suppliers. Writing of the book began at a time when Ted Oangelmayer was burdened with many demands. These demands were from AT&T's own operations, internal suppliers, external suppliers, customers and others looking for a better understanding of the phenomenon of ESO, its impact and, most of all, ways to control and manage it. In a way, this book is a response to these demands by making available a reader friendly document that distills the hard-won experiences of Ted and AT&T. The information and methods in this book have been gained at no small cost and produce results that far exceed expenses. There is, however, a caveat: Success will not be obtained unless there is real management commitment. This means management must allocate the necessary resources and provide active support to ensure that training, auditing, reporting, tracking and an aggressive corrective action program all take place successfully. Ted is an internationally recognized authority, and you will benefit greatly by listening to his advice and following his recommendations.

In today's electronics business, managing an ESO program is an integral part of a complete quality program. In fact, any electronics firm without an active ESO program puts itself and its customers at risk. This book illustrates one good example of the detail and dedication to quality that AT&T expects within its own operations and from its suppliers. Writing of the book began at a time when Ted Oangelmayer was burdened with many demands. These demands were from AT&T's own operations, internal suppliers, external suppliers, customers and others looking for a better understanding of the phenomenon of ESO, its impact and, most of all, ways to control and manage it. In a way, this book is a response to these demands by making available a reader friendly document that distills the hard-won experiences of Ted and AT&T. The information and methods in this book have been gained at no small cost and produce results that far exceed expenses. There is, however, a caveat: Success will not be obtained unless there is real management commitment. This means management must allocate the necessary resources and provide active support to ensure that training, auditing, reporting, tracking and an aggressive corrective action program all take place successfully. Ted is an internationally recognized authority, and you will benefit greatly by listening to his advice and following his recommendations.

This volume is the first in a series of three books addressing Electrostatic Discharge (ESD) physics, devices, circuits and design across the full range of integrated circuit technologies. ESD Physics and Devices provides a concise treatment of the ESD phenomenon and the physics of devices operating under ESD conditions. Voldman presents an accessible introduction to the field for engineers and researchers requiring a solid grounding in this important area. The book contains advanced CMOS, Silicon On Insulator, Silicon Germanium, and Silicon Germanium Carbon. In addition it also addresses ESD in advanced CMOS with discussions on shallow trench isolation (STI), Copper and Low K materials. Provides a clear understanding of ESD device physics and the fundamentals of ESD phenomena. Analyses the behaviour of semiconductor devices under ESD conditions. Addresses the growing awareness of the problems resulting from ESD phenomena in advanced integrated circuits. Covers ESD testing, failure criteria and scaling theory for CMOS, SOI (silicon on insulator), BiCMOS and BiCMOS SiGe (Silicon Germanium) technologies for the first time. Discusses the design and development implications of ESD in semiconductor technologies. An invaluable reference for EMC non-specialist engineers and researchers working in the fields of IC and transistor design. Also, suitable for researchers and advanced students in the fields of device/circuit modelling and semiconductor reliability.

Electrostatic discharge (ESD) continues to impact semiconductor manufacturing, semiconductor components and systems, as technologies scale from micro- to nano electronics. This book introduces the fundamentals of ESD, electrical overstress (EOS), electromagnetic interference (EMI), electromagnetic compatibility (EMC), and latchup, as well as provides a coherent overview of the semiconductor manufacturing environment and the final system assembly. It provides an illuminating look into the integration of ESD protection networks followed by examples in specific technologies, circuits, and chips. The text is unique in covering semiconductor chip manufacturing issues, ESD semiconductor chip design, and system problems confronted today as well as the future of ESD phenomena and nano-technology. Look inside for extensive coverage on: The fundamentals of electrostatics, triboelectric charging, and how they relate to present day manufacturing environments of micro-electronics to nano-technology Semiconductor manufacturing handling and auditing processing to avoid ESD failures ESD, EOS, EMI, EMC, and latchup semiconductor component and system level testing to demonstrate product resilience from human body model (HBM), transmission line pulse (TLP), charged device model (CDM), human metal model (HMM), cable discharge events (CDE), to system level IEC 61000-4-2 tests ESD on-chip design and process manufacturing practices and solutions to improve ESD semiconductor chip solutions, also practical off-chip ESD protection and system level solutions to provide more robust systems System level concerns in servers, laptops, disk drives, cell phones, digital cameras, hand held devices, automobiles, and space applications Examples of ESD design for state-of-the-art technologies, including CMOS, BiCMOS, SOI, bipolar technology, high voltage CMOS (HVCMOS), RF CMOS, smart power, magnetic recording technology, micro-machines (MEMs) to nano-structures ESD Basics: From Semiconductor Manufacturing to Product Use complements the author’s series of books on ESD protection. For those new to the field, it is an essential reference and a useful insight into the issues that confront modern technology as we enter the Nano-electronic Era.

This report is the result of an initial study effort to identify the management information needs and to define the requirements for an integrated information system within the AF Electronic Systems Division (ESD) acquisition environment. The Management Information System (MIS) functional requirements for the ESD Program Office are defined in terms of the Computer-Aided Design and Specification Tool. The development of the computer data base and a description of the MIS structure is included in the report. This report addresses management areas such as cost/budgeting, scheduling, tracking capabilities, and ECP control.