Where conventional testing and inspection techniques fail at the microscale, optical techniques provide a fast, robust, noninvasive, and relatively inexpensive alternative for investigating the properties and quality of microsystems. Speed, reliability, and cost are critical factors in the continued scale-up of microsystems technology across many industries, and optical techniques are in a unique position to satisfy modern commercial and industrial demands. Optical Inspection of Microsystems, Second Edition, extends and updates the first comprehensive survey of the most important optical measurement techniques to be successfully used for the inspection of microsystems. Under the guidance of accomplished researcher Wolfgang Osten, expert contributors from industrial and academic institutions around the world share their expertise and experience with techniques such as image processing, image correlation, light scattering, scanning probe microscopy, confocal microscopy, fringe projection, grid and moire techniques, interference microscopy, laser-Doppler vibrometry, digital holography, speckle metrology, spectroscopy, and sensor fusion technologies. They also examine modern approaches to data acquisition and processing, such as the determination of surface features and the estimation of uncertainty of measurement results. The book emphasizes the evaluation of various system properties and considers encapsulated components to increase quality and reliability. Numerous practical examples and illustrations of optical testing reinforce the concepts. Supplying effective tools for increased quality and reliability, this book Provides a comprehensive, up-to-date overview of optical techniques for the measurement and inspection of microsystems Discusses image correlation, displacement and strain measurement, electro-optic holography, and speckle metrology techniques Offers numerous practical examples and illustrations Includes calibration of optical measurement systems for the inspection of MEMS Presents the characterization of dynamics of MEMS

Where conventional testing and inspection techniques fail at the micro-scale, optical techniques provide a fast, robust, and relatively inexpensive alternative for investigating the properties and quality of microsystems. Speed, reliability, and cost are critical factors in the continued scale-up of microsystems technology across many industries, and optical techniques are in a unique position to satisfy modern commercial and industrial demands. Optical Inspection of Microsystems is the first comprehensive, up-to-date survey of the most important and widely used full-field optical metrology and inspection technologies. Under the guidance of accomplished researcher Wolfgang Osten, expert contributors from industrial and academic institutions around the world share their expertise and experience with techniques such as image correlation, light scattering, scanning probe microscopy, confocal microscopy, fringe projection, grid and moiré techniques, interference microscopy, laser Doppler vibrometry, holography, speckle metrology, and spectroscopy. They also examine modern approaches to data acquisition and processing. The book emphasizes the evaluation of various properties to increase reliability and promote a consistent approach to optical testing. Numerous practical examples and illustrations reinforce the concepts. Supplying advanced tools for microsystem manufacturing and characterization, Optical Inspection of Microsystems enables you to reach toward a higher level of quality and reliability in modern micro-scale applications.

Optical Methods of Measurement: Wholefield Techniques, Second Edition provides a comprehensive collection of wholefield optical measurement techniques for engineering applications. Along with the reorganization of contents, this edition includes a new chapter on optical interference, new material on nondiffracting and singular beams and their applications, and updated bibliography and additional reading sections. The book explores the propagation of laser beams, metrological applications of phase-singular beams, various detectors such as CCD and CMOS devices, and recording materials. It also covers interference, diffraction, and digital fringe pattern measurement techniques, with special emphasis on phase measurement interferometry and algorithms. The remainder of the book focuses on theory, experimental arrangements, and applications of wholefield techniques. The author discusses digital hologram interferometry, digital speckle photography, digital speckle pattern interferometry, Talbot interferometry, and holophotoelasticity. This updated book compiles the major wholefield methods of measurement in one volume. It provides a solid understanding of the techniques by describing the physics behind them. In addition, the examples given illustrate how the techniques solve measurement problems.

Although the theory and principles of optical waveguides have been established for more than a century, the technologies have only been realized in recent decades. Optical Waveguides: From Theory to Applied Technologies combines the most relevant aspects of waveguide theory with the study of current detailed waveguiding technologies, in particular, photonic devices, telecommunication applications, and biomedical optics. With self-contained chapters written by well-known specialists, the book features both fundamentals and applications. The first three chapters examine the theoretical foundations and bases of planar optical waveguides as well as critical optical properties such as birefringence and nonlinear optical phenomena. The next several chapters focus on contemporary waveguiding technologies that include photonic devices and telecommunications. The book concludes with discussions on additional technological applications, including biomedical optical waveguides and the potential of neutron waveguides. As optical waveguides play an increasing part in modern technology, photonics will become to the 21st century what electronics were to the 20th century. Offering both novel insights for experienced professionals and introductory material for novices, this book facilitates a better understanding of the new information era—the photonics century.

Organized as a mini-encyclopedia of infrared optoelectronic applications, this long awaited new edition of an industry standard updates and expands on the groundbreaking work of its predecessor. Pioneering experts, responsible for many advancements in the field, provide engineers with a fundamental understanding of semiconductor physics and the technical information needed to design infrared optoelectronic devices. Fully revised to reflect current developments in the field, Optoelectronics: Infrared-Visible-Ultraviolet Devices and Applications, Second Edition reviews relevant semiconductor fundamentals, including device physics, from an optoelectronic industry perspective. This easy-reading text provides a practical engineering introduction to optoelectronic LEDs and silicon sensor technology for the infrared, visible, and ultraviolet portion of the electromagnetic spectrum. Utilizing a practical and efficient engineering approach throughout, the text supplies design engineers and technical management with quick and uncluttered access to the technical information needed to design new systems.

The recent launches of three fully polarimetric synthetic aperture radar (PolSAR) satellites have shown that polarimetric radar imaging can provide abundant data on the Earth’s environment, such as biomass and forest height estimation, snow cover mapping, glacier monitoring, and damage assessment. Written by two of the most recognized leaders in this field, Polarimetric Radar Imaging: From Basics to Applications presents polarimetric radar imaging and processing techniques and shows how to develop remote sensing applications using PolSAR imaging radar. The book provides a substantial and balanced introduction to the basic theory and advanced concepts of polarimetric scattering mechanisms, speckle statistics and speckle filtering, polarimetric information analysis and extraction techniques, and applications typical to radar polarimetric remote sensing. It explains the importance of wave polarization theory and the speckle phenomenon in the information retrieval problem of microwave imaging and inverse scattering. The authors demonstrate how to devise intelligent information extraction algorithms for remote sensing applications. They also describe more advanced polarimetric analysis techniques for polarimetric target decompositions, polarization orientation effects, polarimetric scattering modeling, speckle filtering, terrain and forest classification, manmade target analysis, and PolSAR interferometry. With sample PolSAR data sets and software available for download, this self-contained, hands-on book encourages you to analyze space-borne and airborne PolSAR and polarimetric interferometric SAR (Pol-InSAR) data and then develop applications using this data.

Speckle study constitutes a multidisciplinary area with inherent complexities. In order to conquer challenges such as the variability of samples and sensitive measurements, researchers must develop a theoretical and statistical understanding of both biological and non-biological metrology using dynamic speckle laser. Dynamic Laser Speckle and Applications discusses the main methodologies used to analyze biospeckle phenomena with a strong focus on experimentation. After establishing a theoretical background in both speckle and biospeckle, the book presents the main methodologies for statistical and image analysis. It then deals with the concept of frequency decomposition before moving on to a discussion of fuzzy methods to treat dynamic speckle data. The book dedicates two sections to applications, including agricultural approaches. Additional features include photo images of experiments and software to aid in easy start-up of dynamic speckle usage. A systematic approach to new dynamic speckle laser phenomena, this book provides the physical theory and statistical background needed to analyze images formed by laser illumination in biological and non-biological samples.