Treatise on Materials Science and Technology, Volume 27: Analytical Techniques for Thin Films covers a set of analytical techniques developed for thin films and interfaces, all based on scattering and excitation phenomena and theories. The book discusses photon beam and X-ray techniques; electron beam techniques; and ion beam techniques. Materials scientists, materials engineers, chemical engineers, and physicists will find the book invaluable.

"Perhaps the most controversial aspect of this volume is the number (V) assigned to the conference in this series. Actually, the first conference to be held under the title "Atomic Collisions in Solids" was held at Sussex University in England in 1969 and the second at Gausdal, Norway in 1971, which would logically make the conference held at Gatlinburg, Tennessee, U.S.A. in 1973 the third (III). However, the appearance of the proceedings of the 1971 Gausdal Conference (published by Gordon and Breach) bore the number IV. The reasoning behind this was that, in. fact, two previous conferences had been largely dedicated to the same subject area. The first of these was at Aarhus, Denmark in 1965 and the second in 1967 was held in Chalk River, Canada. Hence, the number V for the 1973 meeting."--Page v