Applied Scanning Probe Methods VIII
Title | Applied Scanning Probe Methods VIII PDF eBook |
Author | Bharat Bhushan |
Publisher | Springer Science & Business Media |
Total Pages | 512 |
Release | 2007-12-20 |
Genre | Technology & Engineering |
ISBN | 3540740805 |
The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.
Applied Scanning Probe Methods II
Title | Applied Scanning Probe Methods II PDF eBook |
Author | Bharat Bhushan |
Publisher | Springer Science & Business Media |
Total Pages | 456 |
Release | 2006-06-22 |
Genre | Technology & Engineering |
ISBN | 3540274537 |
The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rst there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes.
Applied Scanning Probe Methods III
Title | Applied Scanning Probe Methods III PDF eBook |
Author | Bharat Bhushan |
Publisher | Springer |
Total Pages | 378 |
Release | 2009-09-02 |
Genre | Technology & Engineering |
ISBN | 9783540812654 |
The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf?cient to delineate single atoms. At ?rst there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the - gneticForceMicroscope,MFM,and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes.
Applied Scanning Probe Methods IV
Title | Applied Scanning Probe Methods IV PDF eBook |
Author | Bharat Bhushan |
Publisher | Springer Science & Business Media |
Total Pages | 318 |
Release | 2006-04-28 |
Genre | Technology & Engineering |
ISBN | 3540269142 |
Applied Scanning Probe Methods XI
Title | Applied Scanning Probe Methods XI PDF eBook |
Author | Bharat Bhushan |
Publisher | Springer Science & Business Media |
Total Pages | 281 |
Release | 2008-10-22 |
Genre | Technology & Engineering |
ISBN | 3540850376 |
The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM applications. Real industrial applications are included.
Applied Scanning Probe Methods: Scanning probe microscopy techniques
Title | Applied Scanning Probe Methods: Scanning probe microscopy techniques PDF eBook |
Author | |
Publisher | |
Total Pages | |
Release | 2004 |
Genre | Materials |
ISBN |
Applied Scanning Probe Methods X
Title | Applied Scanning Probe Methods X PDF eBook |
Author | Bharat Bhushan |
Publisher | Springer Science & Business Media |
Total Pages | 475 |
Release | 2007-12-20 |
Genre | Technology & Engineering |
ISBN | 3540740856 |
The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.