Thin Film and Depth Profile Analysis
Title | Thin Film and Depth Profile Analysis PDF eBook |
Author | H. Oechsner |
Publisher | Springer Science & Business Media |
Total Pages | 214 |
Release | 2013-03-08 |
Genre | Technology & Engineering |
ISBN | 3642464998 |
The characterization of thin films and solid interfaces as well as the determina tion of concentration profiles in thin solid layers is one of the fields which re quire a rapid transfer of the results from basic research to technological applica tions and developments. It is the merit of the Dr. Wilhelm Heinrich and Else Heraeus-Stiftung to promote such a transfer by organizing high standard seminars mostly held at the "Physikzentrum" in Bad Honnef near Bonn. The present book has been stimulated by one of these seminars assembling most of the invited speakers as co-authors. The editor appreciates the cooperation of his colleagues contributing to this book. H. Oechsner Kaiserslautern, April 1984 v Contents 1. Introduction. ByH. Oechsner . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1. 1 Requirements for Thin Film and In-Depth Analysis . . . . . . . . . . . . . . . . . . . 1 1. 2 Object and Outl i ne of the Book . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 4 References 2. The Application of Beam and Diffraction Techniques to Thin Film and Surface Micro-Analysis. By H. W. Werner (With 25 Fi gures) . . . . . . . . . . . . . . . . 5 2. 1 Methods to Determine Chemical Structures in Material Research 5 2. 2 Selected Analytical Features Used to Determine Chemical Structures 9 2. 2. 1 Depth Profi 1 ing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 9 a) Destructive Depth Profiling b) Nondestructive Methods for Depth and Thin Film Analysis 15 19 2. 2. 2 Microspot Analysis and Element Imaging 2. 3 Determining Physical Structures in Material Research . . . . . . . . . . . . . . . 27 2. 3. 1 X-Ray Diffraction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27 2. 3. 2 X-Ray Double Crystal Diffraction . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28 2. 3.
Thin Film and Depth Profile Analysis
Title | Thin Film and Depth Profile Analysis PDF eBook |
Author | H. Oechsner |
Publisher | |
Total Pages | 224 |
Release | 1984-11-01 |
Genre | |
ISBN | 9783642465000 |
Depth Profile Analysis of Thin Film Multilayered Structures with Secondary Ion Mass Spectrometry
Title | Depth Profile Analysis of Thin Film Multilayered Structures with Secondary Ion Mass Spectrometry PDF eBook |
Author | Monique Moens |
Publisher | |
Total Pages | |
Release | 1990 |
Genre | |
ISBN |
Surface and Thin Film Analysis
Title | Surface and Thin Film Analysis PDF eBook |
Author | Gernot Friedbacher |
Publisher | John Wiley & Sons |
Total Pages | 514 |
Release | 2011-03-31 |
Genre | Technology & Engineering |
ISBN | 3527636935 |
Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) "... a useful resource..." (Journal of the American Chemical Society)
Depth Profiling of Multilayer Thin Films Using Ion Beam Techniques
Title | Depth Profiling of Multilayer Thin Films Using Ion Beam Techniques PDF eBook |
Author | Mandla Msimanga |
Publisher | |
Total Pages | 0 |
Release | 2022 |
Genre | Electronic books |
ISBN |
Functional properties of thin film structures depend a lot on the thickness and chemical composition of the layer stack. There are many analytical techniques available for the identification and quantification of chemical species of thin film depositions on substrates, down to a few monolayers thickness. For the majority of these techniques, extending the analysis to several tens of nanometres or more requires some form of surface sputtering to access deeper layers. While this has been done successfully, the analysis tends to become quite complex when samples analysed consist of multilayer films of different chemical composition. Ion beam analysis (IBA) techniques using projectile ions of energies in the MeV range have a demonstrated advantage in the study of multilayer thin films in that the analysis is possible without necessarily rupturing the film, up to over 500 nm deep in some cases, and without the use of standards. This chapter looks at theoretical principles, and some unique applications of two of the most widespread IBA techniques: Rutherford Backscattering Spectrometry (RBS) and Elastic Recoil Detection Analysis (ERDA), as applied to multilayer thin film analyses.
Depth Profiling in Thin Films Via Waveguide Spectroscopy
Title | Depth Profiling in Thin Films Via Waveguide Spectroscopy PDF eBook |
Author | |
Publisher | |
Total Pages | |
Release | 1988 |
Genre | |
ISBN |
Fundamentals of Surface and Thin Film Analysis
Title | Fundamentals of Surface and Thin Film Analysis PDF eBook |
Author | Leonard C. Feldman |
Publisher | |
Total Pages | 384 |
Release | 1986 |
Genre | Mathematics |
ISBN |
Contains concise coverage of the major analytical techniques, including Auger electron spectroscopy, X-ray photoelectron spectroscopy, secondary ion mass spectroscopy and RBS methods. Annotation copyrighted by Book News, Inc., Portland, OR