Expert practical and theoretical coverage of runs and scans This volume presents both theoretical and applied aspects of runs and scans, and illustrates their important role in reliability analysis through various applications from science and engineering. Runs and Scans with Applications presents new and exciting content in a systematic and cohesive way in a single comprehensive volume, complete with relevant approximations and explanations of some limit theorems. The authors provide detailed discussions of both classical and current problems, such as: * Sooner and later waiting time * Consecutive systems * Start-up demonstration testing in life-testing experiments * Learning and memory models * "Match" in genetic codes Runs and Scans with Applications offers broad coverage of the subject in the context of reliability and life-testing settings and serves as an authoritative reference for students and professionals alike.

In many statistical applications, scientists have to analyze the occurrence of observed clusters of events in time or space. Scientists are especially interested in determining whether an observed cluster of events has occurred by chance if it is assumed that the events are distributed independently and uniformly over time or space. Scan statistics have relevant applications in many areas of science and technology including geology, geography, medicine, minefield detection, molecular biology, photography, quality control and reliability theory and radio-optics.

The study of scan statistics and their applications to many different scientific and engineering problems have received considerable attention in the literature recently. In addition to challenging theoretical problems, the area of scan statis tics has also found exciting applications in diverse disciplines such as archaeol ogy, astronomy, epidemiology, geography, material science, molecular biology, reconnaissance, reliability and quality control, sociology, and telecommunica tion. This will be clearly evident when one goes through this volume. In this volume, we have brought together a collection of experts working in this area of research in order to review some of the developments that have taken place over the years and also to present their new works and point out some open problems. With this in mind, we selected authors for this volume with some having theoretical interests and others being primarily concerned with applications of scan statistics. Our sincere hope is that this volume will thus provide a comprehensive survey of all the developments in this area of research and hence will serve as a valuable source as well as reference for theoreticians and applied researchers. Graduate students interested in this area will find this volume to be particularly useful as it points out many open challenging problems that they could pursue. This volume will also be appropriate for teaching a graduate-level special course on this topic.

This book contains extended versions of 34 carefully selected and reviewed papers presented at the Third International Conference on Mathematical Methods in Reliability, held in Trondheim, Norway in 2002. It provides a broad overview of current research activities in reliability theory and its applications. There are chapters on reliability modelling, network and system reliability, reliability optimization, survival analysis, degradation and maintenance modelling, and software reliability. The authors are all leading experts in the field.A particular feature of the book is a historical review by Professor Richard E Barlow, well known for his pioneering research on reliability. The list of authors also includes the plenary session speakers Odd O Aalen, Philip J Boland, Sallie A Keller-McNulty, and Nozer Singpurwalla.

A rigorous, comprehensive introduction to the finite Markov chain imbedding technique for studying the distributions of runs and patterns from a unified and intuitive viewpoint, away from the lines of traditional combinatorics.

Beschrijving van vijfentwintig open source applicaties.