The first edition, published in 1973, has become a classicreference in the field. Now with the second edition, readers willfind information on key new topics such as neural networks andstatistical pattern recognition, the theory of machine learning,and the theory of invariances. Also included are worked examples,comparisons between different methods, extensive graphics, expandedexercises and computer project topics. An Instructor's Manual presenting detailed solutions to all theproblems in the book is available from the Wiley editorialdepartment.

The use of pattern recognition and classification is fundamental to many of the automated electronic systems in use today. However, despite the existence of a number of notable books in the field, the subject remains very challenging, especially for the beginner. Pattern Recognition and Classification presents a comprehensive introduction to the core concepts involved in automated pattern recognition. It is designed to be accessible to newcomers from varied backgrounds, but it will also be useful to researchers and professionals in image and signal processing and analysis, and in computer vision. Fundamental concepts of supervised and unsupervised classification are presented in an informal, rather than axiomatic, treatment so that the reader can quickly acquire the necessary background for applying the concepts to real problems. More advanced topics, such as semi-supervised classification, combining clustering algorithms and relevance feedback are addressed in the later chapters. This book is suitable for undergraduates and graduates studying pattern recognition and machine learning.

Pattern recognition is a scientific discipline that is becoming increasingly important in the age of automation and information handling and retrieval. Patter Recognition, 2e covers the entire spectrum of pattern recognition applications, from image analysis to speech recognition and communications. This book presents cutting-edge material on neural networks, - a set of linked microprocessors that can form associations and uses pattern recognition to "learn" -and enhances student motivation by approaching pattern recognition from the designer's point of view. A direct result of more than 10 years of teaching experience, the text was developed by the authors through use in their own classrooms. *Approaches pattern recognition from the designer's point of view *New edition highlights latest developments in this growing field, including independent components and support vector machines, not available elsewhere *Supplemented by computer examples selected from applications of interest

PATTERN CLASSIFICATION a unified view of statistical and neural approaches The product of years of research and practical experience in pattern classification, this book offers a theory-based engineering perspective on neural networks and statistical pattern classification. Pattern Classification sheds new light on the relationship between seemingly unrelated approaches to pattern recognition, including statistical methods, polynomial regression, multilayer perceptron, and radial basis functions. Important topics such as feature selection, reject criteria, classifier performance measurement, and classifier combinations are fully covered, as well as material on techniques that, until now, would have required an extensive literature search to locate. A full program of illustrations, graphs, and examples helps make the operations and general properties of different classification approaches intuitively understandable. Offering a lucid presentation of complex applications and their algorithms, Pattern Classification is an invaluable resource for researchers, engineers, and graduate students in this rapidly developing field.

This is the first textbook on pattern recognition to present the Bayesian viewpoint. The book presents approximate inference algorithms that permit fast approximate answers in situations where exact answers are not feasible. It uses graphical models to describe probability distributions when no other books apply graphical models to machine learning. No previous knowledge of pattern recognition or machine learning concepts is assumed. Familiarity with multivariate calculus and basic linear algebra is required, and some experience in the use of probabilities would be helpful though not essential as the book includes a self-contained introduction to basic probability theory.

This 1996 book explains the statistical framework for pattern recognition and machine learning, now in paperback.

A self-contained and coherent account of probabilistic techniques, covering: distance measures, kernel rules, nearest neighbour rules, Vapnik-Chervonenkis theory, parametric classification, and feature extraction. Each chapter concludes with problems and exercises to further the readers understanding. Both research workers and graduate students will benefit from this wide-ranging and up-to-date account of a fast- moving field.