Besides its coverage of the four important aspects of synchrotron sources, materials and material processes, measuring techniques, and applications, this ready reference presents both important method types: diffraction and tomography. Following an introduction, a general section leads on to methods, while further sections are devoted to emerging methods and industrial applications. In this way, the text provides new users of large-scale facilities with easy access to an understanding of both the methods and opportunities offered by different sources and instruments.

Retaining its proven concept, the second edition of this ready reference specifically addresses the need of materials engineers for reliable, detailed information on modern material characterization methods. As such, it provides a systematic overview of the increasingly important field of characterization of engineering materials with the help of neutrons and synchrotron radiation. The first part introduces readers to the fundamentals of structure-property relationships in materials and the radiation sources suitable for materials characterization. The second part then focuses on such characterization techniques as diffraction and scattering methods, as well as direct imaging and tomography. The third part presents new and emerging methods of materials characterization in the field of 3D characterization techniques like three-dimensional X-ray diffraction microscopy. The fourth and final part is a collection of examples that demonstrate the application of the methods introduced in the first parts to problems in materials science. With thoroughly revised and updated chapters and now containing about 20% new material, this is the must-have, in-depth resource on this highly relevant topic.

Retaining its proven concept, the second edition of this ready reference specifically addresses the need of materials engineers for reliable, detailed information on modern material characterization methods. As such, it provides a systematic overview of the increasingly important field of characterization of engineering materials with the help of neutrons and synchrotron radiation. The first part introduces readers to the fundamentals of structure-property relationships in materials and the radiation sources suitable for materials characterization. The second part then focuses on such characterization techniques as diffraction and scattering methods, as well as direct imaging and tomography. The third part presents new and emerging methods of materials characterization in the field of 3D characterization techniques like three-dimensional X-ray diffraction microscopy. The fourth and final part is a collection of examples that demonstrate the application of the methods introduced in the first parts to problems in materials science. With thoroughly revised and updated chapters and now containing about 20% new material, this is the must-have, in-depth resource on this highly relevant topic.

Selected, Peer reviewed papers from the MECA SENS V (The 5th International Conference on Mechanical Stress Evaluation by Neutrons and Synchrotron Radiation)/ QuBS2009 (The 3rd International Symposium of Quantum Beam Science Directorate of Japan Atomic Energy Agency), Mito 10 - 12 November 2009

Volume is indexed by Thomson Reuters CPCI-S (WoS). This collection addresses specific topics within the field of stress measurement in solids using neutrons, X-rays and synchrotron radiation. Particular attention is paid to multidisciplinary approaches involving an understanding of the measured stress field and the implications of the stress field for the behaviour of materials and components.

This conference brings together leading edge researchers from around the world and is a celebration of the increasingly important relationship between materials science and synchrotron radiation research. Special attention was given to the contribution that Synchrotron Radiation techniques have given to unsolved problems in Materials Science. The main organizer of SRMS-6 was the Brazilian Synchrotron Laboratory, with support from several Brazilian and Latin-American Agencies and Universities. The main topical areas of this conference series are, Archaeological Materials, Catalysts and clusters, Complex oxides, Data-storage and Engineering materials, Films, Surfaces and Interfaces, Geo-physical and Electronic materials, Glasses and Ceramics, Liquids, Magnetism, Materials under Extreme conditions (high pressure, etc.), Metals and Alloys, Metamaterials, Molecular electronics, Multiferroics, Nanostructured materials and Self-assembly, Polymers and Biomaterials, Photo materials, Nanofocus techniques, Strongly correlated materials, Superconducting materials, Industrial use of SR, Instrumentation/Recent Developments.