Micro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems. This analytical technique has shown a dynamic development in the last 15 years and is used for the analysis of small particles, inclusions, of elemental distributions for a wide range of different applications both in research and quality control. The first experiments were performed on synchrotrons but there is a requirement for laboratory instruments which offers a fast and immediate access for analytical results. The book discuss the main components of a μ-XRF instrument and the different measurement modes, it gives an overview about the various instruments types, considers the special requirements for quantification of non-homogeneous materials and presents a wide range of application for single point and multi-point analysis as well as for distribution analysis in one, two and three dimensions.

Provides comprehensive coverage on using X-ray fluorescence for laboratory applications This book focuses on the practical aspects of X-ray fluorescence (XRF) spectroscopy and discusses the requirements for a successful sample analysis, such as sample preparation, measurement techniques and calibration, as well as the quality of the analysis results. X-Ray Fluorescence Spectroscopy for Laboratory Applications begins with a short overview of the physical fundamentals of the generation of X-rays and their interaction with the sample material, followed by a presentation of the different methods of sample preparation in dependence on the quality of the source material and the objective of the measurement. After a short description of the different available equipment types and their respective performance, the book provides in-depth information on the choice of the optimal measurement conditions and the processing of the measurement results. It covers instrument types for XRF; acquisition and evaluation of X-Ray spectra; analytical errors; analysis of homogeneous materials, powders, and liquids; special applications of XRF; process control and automation. An important resource for the analytical chemist, providing concrete guidelines and support for everyday analyses Focuses on daily laboratory work with commercially available devices Offers a unique compilation of knowledge and best practices from equipment manufacturers and users Covers the entire work process: sample preparation, the actual measurement, data processing, assessment of uncertainty, and accuracy of the obtained results X-Ray Fluorescence Spectroscopy for Laboratory Applications appeals to analytical chemists, analytical laboratories, materials scientists, environmental chemists, chemical engineers, biotechnologists, and pharma engineers.

Archaeological Soil and Sediment Micromorphology goes beyond a mere review of current literature and features the most up to date contributions from numerous scientists working in the field. The book represents a groundbreaking and comprehensive resource covering the plethora of applications of micromorphology in archaeology. Archaeological Soil and Sediment Micromorphology offers researchers, students and professionals a systematic tool for the interpretation of thin sections of archaeological contexts. This important resource is also designed to help stimulate the use of micromorphology in archaeology outside Europe, where the technique is less frequently employed. Moreover, the authors hope to strengthen the proper application of soil micromorphology in archaeology, by illustrating its possibilities and referring in several cases to more specialized publications (for instance in the field of plant remains, pottery and phytoliths). Written for anyone interested in the topic, this important text offers: Contributions from most of the world's leading authorities on soil micromorphology A series of chapters on the major topics selected among the most recurrent in literature about archaeological soil micromorphology Systematic descriptions of all important micromorphological features Special analytical tools employed on thin sections, such as SEM/EDS, image analysis, fluorescence microscopy, mass spectrometry, among others Numerous cross-references 400 illustrated full-colour plates The resource provides the most current and essential information for archaeologists, geoarchaeologists, soil scientists and sedimentologists. Comprehensive in scope, Archaeological Soil and Sediment Micromorphology offers professionals and students a much-needed tool for the interpretation of thin sections of archaeological contexts.

Microscopic X-ray Fluorescence Analysis Edited by Koen H. A. Janssens, Freddy C. V. Adams Department of Chemistry, University of Antwerp, Belgium and Anders Rindby Department of Physics, Chalmers University of Technology, Göteborg, Sweden In the last 10-15 years many analytical advances in X-ray fluorescence analysis (XRF) have taken place, giving rise to non-destructive ultrasensitive surface analyses of materials. One of the variants of XRF developed is micro-XRF (μ-XRF), which is able to analyse the distribution of major, minor and trace elements in microscopic sample surface areas. Due to the availability of commercial instrumentation and the development of simple devices for focusing X-rays, μ-XRF has increased in popularity and is able to fill the gap between bulk X-ray fluorescence and electron probe X-ray microanalysis (EPXMA). Microscopic X-ray Fluorescence Analysis is the first single volume to bring together introductory and advanced information on the essential aspects of the technique, thereby providing an excellent overview of the developments and applications of μ-XRF. Topics discussed in the book include: * Interaction of X-rays with matter * Micro-focusing X-ray optics * Instrumentation for μ-XRF with laboratory and synchrotron sources * Evaluation and calibration of μ-XRF data * Comparison of μ-XRF to other microanalytical techniques. In addition, the final chapters of the book describe applications of μ-XRF in the geosciences, in art and archaeology, environmental and biological applications, and the use of μ-XRF for industrial purposes. Finally an overview is presented of some of the new directions both laboratory and synchrotron μ-XRF are likely to take in the 21st Century.

X-ray fluorescence spectrometry (XRF) is a well-established analytical technique for qualitative and quantitative elemental analysis of a wide variety of routine quality control and research samples. Among its many desirable features, it delivers true multi-element character analysis, acceptable speed and economy, easy of automation, and the capacity to analyze solid samples. This remarkable contribution to this field provides a comprehensive and up-to-date account of basic principles, recent developments, instrumentation, sample preparation procedures, and applications of XRF analysis. If you are a professional in materials science, analytic chemistry, or physics, you will benefit from not only the review of basics, but also the newly developed technologies with XRF. Those recent technological advances, including the design of low-power micro- focus tubes and novel X-ray optics and detectors, have made it possible to extend XRF to the analysis of low-Z elements and to obtain 2D or 3D information on a micrometer-scale. And, the recent development and commercialization of bench top and portable instrumentation, offering extreme simplicity of operation in a low-cost design, have extended the applications of XRF to many more analytical problems.

X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students.

"Updates fundamentals and applications of all modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron radiation induced x-ray emission. Promotes the accurate measurement of samples while reducing the scattered background in the x-ray spectrum."