The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. Much like earlier books in the series, this collection of papers, first published in 2001, brings together the materials science community and the characterization techniques that use synchrotron radiation.

The 57 papers update the status of characterization techniques that use synchrotron radiation since the previous symposium on the subject in the spring of 1996. The techniques considered include X-ray absorption and scattering, imaging, tomography, microscopy, and topographic methods. Among the materials are surfaces, interfaces, electronic materials, metal oxides, solar cells, thin films, carbides, polymers, alloys, nanoparticles, and graphitic materials. Some of the papers are doubled spaced. Annotation copyrighted by Book News, Inc., Portland, OR

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Each year synchrotron facilities, both in the United States and in other countries, are utilized for more applications of synchrotron radiation as they pertain to materials science. Both basic and applied research possibilities are manyfold, including studies of materials mentioned below and those that are yet to be discovered. The combination of synchrotron-based spectroscopic techniques with ever-increasing high-resolution microscopy allows researchers to study very small domains of materials in an attempt to understand their chemical and electronic properties. This is especially important for composites and related materials involving material bonding interfaces. This book brings together the materials science community and the characterization techniques that use synchrotron radiation. Topics include surfaces, interfaces, electronic materials, metal oxides, metal sulfides, radiation detector materials, thin films, carbides, polymers, alloys, nanoparticles, and metal composites. Results reported in the volume address recent advances in X-ray absorption and scattering, imaging, tomography, microscopy, and diffraction methods.

Meeting the long-felt need for in-depth information on one of the most advanced material characterization methods, a top team of editors and authors from highly prestigious facilities and institutions covers a range of synchrotron techniques that have proven useful for materials research. Following an introduction to synchrotron radiation and its sources, the second part goes on to describe the various techniques that benefit from this especially bright light, including X-ray absorption, diffraction, scattering, imaging, and lithography. The thrid and final part provides an overview of the applications of synchrotron radiation in materials science. bridging the gap between specialists in synchrotron research and material scientists, this is a unique and indispensable resource for academic and industrial researchers alike.