The Asian Test Symposium (ATS) provides an open forum for researchers and industrial practitioners from all countries of the world to exchange innovative ideas on system, board, and device testing with design, manufacturing, and field consideration in mind

Field-Programmable Gate Arrays (FPGAs) have emerged as an attractive means of implementing logic circuits, providing instant manufacturing turnaround and negligible prototype costs. They hold the promise of replacing much of the VLSI market now held by mask-programmed gate arrays. FPGAs offer an affordable solution for customized VLSI, over a wide variety of applications, and have also opened up new possibilities in designing reconfigurable digital systems. Field-Programmable Gate Arrays discusses the most important aspects of FPGAs in a textbook manner. It provides the reader with a focused view of the key issues, using a consistent notation and style of presentation. It provides detailed descriptions of commercially available FPGAs and an in-depth treatment of the FPGA architecture and CAD issues that are the subjects of current research. The material presented is of interest to a variety of readers, including those who are not familiar with FPGA technology, but wish to be introduced to it, as well as those who already have an understanding of FPGAs, but who are interested in learning about the research directions that are of current interest.

In the early days of digital design, we were concerned with the logical correctness of circuits. We knew that if we slowed down the clock signal sufficiently, the circuit would function correctly. With improvements in the semiconductor process technology, our expectations on speed have soared. A frequently asked question in the last decade has been how fast can the clock run. This puts significant demands on timing analysis and delay testing. Fueled by the above events, a tremendous growth has occurred in the research on delay testing. Recent work includes fault models, algorithms for test generation and fault simulation, and methods for design and synthesis for testability. The authors of this book, Angela Krstic and Tim Cheng, have personally contributed to this research. Now they do an even greater service to the profession by collecting the work of a large number of researchers. In addition to expounding such a great deal of information, they have delivered it with utmost clarity. To further the reader's understanding many key concepts are illustrated by simple examples. The basic ideas of delay testing have reached a level of maturity that makes them suitable for practice. In that sense, this book is the best x DELAY FAULT TESTING FOR VLSI CIRCUITS available guide for an engineer designing or testing VLSI systems. Tech niques for path delay testing and for use of slower test equipment to test high-speed circuits are of particular interest.

In this book, a global team of experts from academia, research institutes and industry presents their vision on how new nano-chip architectures will enable the performance and energy efficiency needed for AI-driven advancements in autonomous mobility, healthcare, and man-machine cooperation. Recent reviews of the status quo, as presented in CHIPS 2020 (Springer), have prompted the need for an urgent reassessment of opportunities in nanoelectronic information technology. As such, this book explores the foundations of a new era in nanoelectronics that will drive progress in intelligent chip systems for energy-efficient information technology, on-chip deep learning for data analytics, and quantum computing. Given its scope, this book provides a timely compendium that hopes to inspire and shape the future of nanoelectronics in the decades to come.